Test of next-generation SoC and mixed-signal ICs

Advantest has released two test systems targeting at sys-tem-on-a-chip (SoC) devices that combine both digital and analog circuitry. The T6683 has a maximum test speed of 1GHz and up to 2,048 pins (1,024 I/O). For verification with up to 500MHz using a maximum of 1,024 pins, the T6673 was introduced. To perform accurate tests on microprocessors and microcontrollers, these systems use a fly-by architecture to quickly switch between driving data into and receiving data out of the I/Os. For high-pin count ICs, the T6683 has implemented the ability to control each pin independently, allowing tests with a maximum of each 1,024 input and output channels. To handle the large currents required by microprocessors, an option supplies up to 256A. With its ability to simultaneously test a maximum of eight devices at up to 500 MHz, the T6673 system further reduces costs and has enhanced mixed-signal test functionality. Vastly improving the operating time of its internal CPU and accelerating bus speed reduce the time required for simultaneous tests of mixed-signal devices. To extend the range of the mixed-signal test-ing capabilities, the company has readied a wide variety of options for analog test, for example, for baseband devices.

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