Packaging specialist Amkor has developed an own test platform for radio frequency devices that is capable of dramatically reducing test times for RF components, some as much as 80%. The platform consists of proprietary software that optimi-zes standard instrumentation systems for faster results. RF testing for dual band power amplifiers (PA) on a typical ATE can take as long as 1.8s. PAs can be tested on this platform in as fast as 470ms. Low noise amplifiers, which normally take up to 1.3s, can be tested as fast as 170ms. In addition to the reduced test time, the capital cost of the system is significantly less than other solutions available. Amkor will use the system exclusively; it will not be sold commercially. This platform also is ideally suited for high-volume testing of mixers, RF switches, phase-locked loops and voltage-controlled oscillators. The market for wireless and mobile communications devices is expected to nearly double by 2004, (2001 $32.7bn; 2004 $60.3bn) according to analyst IC Insights.
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