Macrotron Process Technologies (MPT) has developed the X-ray inspection system MXR 160 in co-operation with Asys. The high-end instrument features a novell off-axis inspection technology. The MXR stands for thenext generation of ultra-high resolution, real-time X-ray inspection equipment focusing on electronic applications. The modular architecture allows for flexible configuration of different imaging set-ups, as well as configurations for manual or automatic loading. The system includes a multi-axis manipulator mechanism including a rotating table, and has two additional axes to tilt the tube and the detector. A feedback loop makes sure that the object always stays centered in the inspection window. As a result, the instrument provides two unique inspection modes which are the automatic off-axis circle mode (ACM), and automatic center repositioning (ACR). A key advantage of off-axis technology is that a BGA bump, for example, can be automatically inspected under an optimum angle from every site, which provides true 3D information. The system is shipped together with the X-AIP Software, an advanced image processing tool set for QA, and an algorithm measurement library for automated operation.
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EPP 198
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