ECT’s strip contactor technology for simultaneous massively parallel test provides design strategies for Kelvin, high current and thermal applications on devices. This method makes it possible to test unlimited device sites based on tester resources. The result is a faster and more economical and reliable test. The supplier offers a turnkey package – from performance board through contactor interface manufacturing solutions. Experiences in semiconductor test solutions, interconnect technology and R&D guarantee successful integration throughout the test process. ECT provides its partners engineering assistance in creating strip standards and product development.
EPP 212
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